Effect of random disorder on the critical behavior of Josephson junction arrays
D. C. Harris, S. T. Herbert, D. Stroud, J. C. Garland
DOI 10.1103/PhysRevLett.67.3606 · Physical Review Letters
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Abstract
Random percolative disorder has been introduced into 300×300 arrays of Nb-Au-Nb proximity-coupled junctions. Our measurements of dc transport properties show that large amounts of random disorder, although depressing Tc and broadening the resistive transition, do not alter the scale invariance of the phase transition. These results are described by a model which rescales the Josephson lattice by the percolation correlation length. The relevance of the observations to granular thin films is discussed.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 8.85 | Pressure not reported | unknown |
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