Distortions to the penetration depth and coherence length of superconductor/normal-metal superlattices
P. Quarterman, Nathan Satchell, B. J. Kirby, Reza Loloee, Gavin Burnell, Norman O. Birge, J. A. Borchers
DOI 10.1103/PhysRevMaterials.4.074801 · Physical Review Materials
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Abstract
Superconducting (S) thin film superlattices composed of Nb and a normal-metal spacer (N) have been extensively utilized in Josephson junctions given their favorable surface roughness compared to Nb films of comparable thickness. In this work, we characterize the London penetration depth and Ginzburg-Landau coherence lengths of S/N superlattices using polarized neutron reflectometry and electrical transport. Despite the normal-metal spacer layers being only approximately 8% of the total superlattice thickness, we surprisingly find that the introduction of these thin N spacers between S layers leads to a dramatic increase in the measured London penetration depth compared to that of a single Nb film of comparable thickness. Using the measured values for the effective in- and out-of-plane coherence lengths, we quantify the induced anisotropy of the superlattice samples and compare to a single Nb film sample. From these results, we find that the superlattices behave similarly to layered 2D superconductors.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 9 | Pressure not reported | unknown |
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