Scanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films
Ofer Yuli, Itay Asulin, Gad Koren, Oded Millo
arXiv:0707.0551 · DOI 10.1103/PhysRevB.75.184521 · 2007-07-04 · Physical Review B
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Abstract
Using scanning tunneling spectroscopy we examined the local density of states of thin c-axis La2-xSrxCuO4 films, over wide doping and temperature ranges. We found that the pseudogap exists only at doping levels lower than optimal. For x = 0.12, close to the 'anomalous' x = 1/8 doping level, a zero bias conductance peak was the dominant spectral feature, instead of the excepted V- shaped (c-axis tunneling) gap structure. We have established that this surprising effect cannot be explained by tunneling into (110) facets. Possible origins for this unique behavior are discussed.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| La1.88Sr0.12CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 27 | Pressure not reported | unknown |
| La1.88Sr0.12CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 31 | Pressure not reported | unknown |
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