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Resistance noise in Bi_2Sr_2CaCu_2O$_{8+δ}$

L. Fruchter, H. Raffy, Z. Z. Li

arXiv:0708.0117 · DOI 10.1103/PhysRevB.76.212503 · 2007-08-01 · Physical Review B

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Abstract

The resistance noise in a Bi_2Sr_2CaCu_2O$_{8+δ}$ thin film is found to increase strongly in the underdoped regime. While the increase of the raw resistance noise with decreasing temperature appears to roughly track the previously reported pseudogap temperature for this material, standard noise analysis rather suggests that the additional noise contribution is driven by the proximity of the superconductor-insulator transition.

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FormulaReported Tc (K)Pressure (GPa)Type
Bi2Sr2CaCu2O8+δ

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18Pressure not reportedunknown

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