Momentum-resolved charge excitations in high-Tc cuprates studied by resonant inelastic x-ray scattering
K. Ishii, M. Hoesch, T. Inami, K. Kuzushita, K. Ohwada, M. Tsubota, Y. Murakami, J. Mizuki, Y. Endoh, K. Tsutsui, T. Tohyama, S. Maekawa, K. Yamada, T. Masui, S. Tajima, H. Kawashima, J. Akimitsu
arXiv:0708.3534 · DOI 10.1016/j.jpcs.2008.06.041 · 2007-08-27 · Journal of Physics and Chemistry of Solids
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Abstract
We report a Cu K-edge resonant inelastic x-ray scattering (RIXS) study of high-Tc cuprates. Momentum-resolved charge excitations in the CuO2 plane are examined from parent Mott insulators to carrier-doped superconductors. The Mott gap excitation in undoped insulators is found to commonly show a larger dispersion along the [pi,pi] direction than the [pi,0] direction. On the other hand, the resonance condition displays material dependence. Upon hole doping, the dispersion of the Mott gap excitation becomes weaker and an intraband excitation appears as a continuum intensity below the gap at the same time. In the case of electron doping, the Mott gap excitation is prominent at the zone center and a dispersive intraband excitation is observed at finite momentum transfer.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Ca1.8Na0.2CuO2Br2 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 14 | Pressure not reported | unknown |
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