Experimental evidence for a surface distribution of two-level systems in superconducting lithographed microwave resonators
Jiansong Gao, Miguel Daal, Peter Day, Benjamin Mazin, Henry LeDuc, Anastasios Vayonakis, Shwetank Kumar, Bernard Sadoulet, Jonas Zmuidzinas
arXiv:0802.4457 · DOI 10.1063/1.2906373 · 2008-02-29
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Abstract
We present measurements of the temperature-dependent frequency shift of five niobium superconducting coplanar waveguide microresonators with center strip widths ranging from 3 $μ$m to 50 $μ$m, taken at temperatures in the range 100-800 mK, far below the 9.2 K transition temperature of niobium. These data agree well with the two-level system (TLS) theory. Fits to this theory provide information on the number of TLS that interact with each resonator geometry. The geometrical scaling indicates a surface distribution of TLS, and the data are consistent with a TLS surface layer thickness of order a few nm, as might be expected for a native oxide layer.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 9.2 | Pressure not reported | unknown |
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