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Experimental evidence for a surface distribution of two-level systems in superconducting lithographed microwave resonators

Jiansong Gao, Miguel Daal, Peter Day, Benjamin Mazin, Henry LeDuc, Anastasios Vayonakis, Shwetank Kumar, Bernard Sadoulet, Jonas Zmuidzinas

arXiv:0802.4457 · DOI 10.1063/1.2906373 · 2008-02-29

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Abstract

We present measurements of the temperature-dependent frequency shift of five niobium superconducting coplanar waveguide microresonators with center strip widths ranging from 3 $μ$m to 50 $μ$m, taken at temperatures in the range 100-800 mK, far below the 9.2 K transition temperature of niobium. These data agree well with the two-level system (TLS) theory. Fits to this theory provide information on the number of TLS that interact with each resonator geometry. The geometrical scaling indicates a surface distribution of TLS, and the data are consistent with a TLS surface layer thickness of order a few nm, as might be expected for a native oxide layer.

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FormulaReported Tc (K)Pressure (GPa)Type
Nb

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9.2Pressure not reportedunknown

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