Dynamical scaling of $YBa_2Cu_3O_{7-δ}$ thin film conductivity in zero field
Hua Xu, Su Li, C. J. Lobb, Steven M. Anlage
arXiv:0803.0965 · DOI 10.1103/PhysRevB.80.104518 · 2008-03-06 · Physical Review B
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Abstract
We study dynamic fluctuation effects of $YBa_2Cu_3O_{7-δ}$ thin films in zero field around $T_c$ by doing frequency-dependent microwave conductivity measurements at different powers. The length scales probed in the experiments are varied systematically allowing us to analyze data which are not affected by the finite thickness of the films, and to observe single-parameter scaling. DC current-voltage characteristics have also been measured to independently probe fluctuations in the same samples. The combination of DC and microwave measurements allows us to precisely determine critical parameters. Our results give a dynamical scaling exponent $z=1.55\pm0.15$, which is consistent with model E-dynamics.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 90 | Pressure not reported | unknown |
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 89.25 | Pressure not reported | unknown |
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