Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

R. Barends; H. L. Hortensius; T. Zijlstra; J. J. A. Baselmans; S. J. C. Yates; J. R. Gao; T. M. Klapwijk

doi:10.1063/1.2937837

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Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

R. Barends, H. L. Hortensius, T. Zijlstra, J. J. A. Baselmans, S. J. C. Yates, J. R. Gao, T. M. Klapwijk

arXiv:0804.3499 · DOI 10.1063/1.2937837 · 2008-04-22 · Applied Physics Letters

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Abstract

We study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiOx dielectric layers of various thicknesses. The resonance frequency develops a non-monotonic temperature dependence with increasing SiOx layer thickness. The increase in the noise is independent of the SiOx thickness, demonstrating that the noise is not dominantly related to the low temperature resonance frequency deviations.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
NbTiN Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	14.8	Pressure not reported	unknown
Ta Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	4.43	Pressure not reported	unknown
Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	9.23	Pressure not reported	unknown