Qubit decoherence due to detector switching
I. Serban, F. K. Wilhelm
arXiv:0905.3045 · DOI 10.1140/EPJQT/S40507-015-0020-6 · 2009-05-19 · EPJ Quantum Technology
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Abstract
We provide insight into the qubit measurement process involving a switching type of detector. We study the switching-induced decoherence during escape events. We present a simple method to obtain analytical results for the qubit dephasing and bit-flip errors, which can be easily adapted to various systems. Within this frame we investigate potential of switching detectors for a fast but only weakly invasive type of detection. We show that the mechanism that leads to strong dephasing, and thus fast measurement, inverts potential bit flip errors due to an intrinsic approximate time reversal symmetry.
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