Measurement of Conduction Electron Polarization Via the Pairing Resonance

Y. M. Xiong; P. W. Adams; G. Catelani

doi:10.1103/PhysRevLett.103.067009

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Measurement of Conduction Electron Polarization Via the Pairing Resonance

Y. M. Xiong, P. W. Adams, G. Catelani

arXiv:0907.1800 · DOI 10.1103/PhysRevLett.103.067009 · 2009-07-10 · Physical review letters

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Abstract

We show that the pairing resonance in the Pauli-limited normal state of ultra-thin superconducting Al films provides a spin-resolved probe of conduction electron polarization in thin magnetic films. A superconductor-insulator-ferromagnet tunneling junction is used to measure the density of states in supercritical parallel magnetic fields that are well beyond the Clogston-Chandresekhar limit, thus greatly extending the field range of the tunneling density of states technique. The applicability and limitations of using the pairing resonance as a spin probe are discussed.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	—