Stability of exfoliated Bi$_2$Sr$_2$Dy$_x$Ca$_{1-x}$Cu$_2$O$_{8+δ}$ studied by Raman microscopy
L. J. Sandilands, J. X. Shen, G. M. Chugunov, F. Zhao, Shimpei Ono, Yoichi Ando, K. S. Burch
arXiv:1003.1979 · 2010-03-09
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Abstract
Nanometer thick cuprates are an appealing platform for devices as well as exploring the roles of dimensionality, disorder, and free carrier density in these compounds. To this end we have produced exfoliated crystals of Bi2Sr2CaCu2O8 on oxidized silicon substrates. The exfoliated crystals were characterized via Atomic Force and polarized Raman microscopies. Proper procedures for production, handling and monitoring of these thin oxides are described. Subtle differences between the exfoliated and bulk crystals are also discussed.
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