Polarization dependence and symmetry analysis in indirect K-edge RIXS

G. Chabot-Couture; J. N. Hancock; P. K. Mang; D. M. Casa; T. Gog; M. Greven

doi:10.1103/PhysRevB.82.035113

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Polarization dependence and symmetry analysis in indirect K-edge RIXS

G. Chabot-Couture, J. N. Hancock, P. K. Mang, D. M. Casa, T. Gog, M. Greven

arXiv:1003.5348 · DOI 10.1103/PhysRevB.82.035113 · 2010-03-28 · Physical Review B

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Abstract

We present a study of the charge-transfer excitations in undoped Nd2CuO4 using resonant inelastic X-ray scattering (RIXS) at the Cu K-edge. At the Brillouin zone center, azimuthal scans that rotate the incident-photon polarization within the CuO2 planes reveal weak fourfold oscillations. A comparison of spectra taken in different Brillouin zones reveals a spectral weight decrease at high energy loss from forward- to back-scattering. We show that these are scattered-photon polarization effects related to the properties of the observed electronic excitations. Each of the two effects constitutes about 10% of the inelastic signal while the '4p-as-spectator' approximation describes the remaining 80%. Raman selection rules can accurately model our data, and we conclude that the observed polarization-dependent RIXS features correspond to Eg and B1g charge-transfer excitations to non-bonding oxygen 2p bands, above 2.5 eV energy-loss, and to an Eg d->d excitation at 1.65 eV.