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Penetration depth of electron-doped-infinite-layer Sr$_{0.88}$La$_{0.12}$CuO$_{2+x}$ thin films

L. Fruchter, V. Jovanovic, H. Raffy, Sid Labdi, F. Bouquet, Z. Z. Li

arXiv:1003.5559 · DOI 10.1103/PhysRevB.82.144529 · 2010-03-29 · Physical Review B

T1experimental9 citations

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Abstract

The in-plane penetration depth of Sr$_{0.88}$La$_{0.12}$CuO$_{2+x}$ thin films at various doping obtained from oxygen reduction has been measured, using AC susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Sr0.88La0.12CuO2+x

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19Pressure not reportedzero_resistance
Sr0.88La0.12CuO2+x

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

15Pressure not reportedzero_resistance
Sr0.88La0.12CuO2+x

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

14Pressure not reportedzero_resistance
Sr0.88La0.12CuO2+x

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

13Pressure not reportedzero_resistance
Sr0.88La0.12CuO2+x

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

11Pressure not reportedzero_resistance

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