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Raman light scattering study and microstructural analysis of epitaxial films of the electron-doped superconductor La_{2-x}Ce_{x}CuO_{4}

M. Rahlenbeck, M. Wagenknecht, A. Tsukada, D. Koelle, R. Kleiner, B. Keimer, C. Ulrich

arXiv:1005.1235 · DOI 10.1140/epjb/e2010-00166-6 · 2010-05-07 · The European Physical Journal B

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Abstract

We present a detailed temperature-dependent Raman light scattering study of optical phonons in molecular-beam-epitaxy-grown films of the electron-doped superconductor La_{2-x}Ce_{x}CuO_{4} close to optimal doping (x ~ 0.08, T_c = 29 K and x ~ 0.1, T_c = 27 K). The main focus of this work is a detailed characterization and microstructural analysis of the films. Based on micro-Raman spectroscopy in combination with x-ray diffraction, energy-dispersive x-ray analysis, and scanning electron microscopy, some of the observed phonon modes can be attributed to micron-sized inclusions of Cu_{2}O. In the slightly underdoped film (x ~ 0.08), both the Cu_{2}O modes and others that can be assigned to the La_{2-x}Ce_{x}CuO_{4} matrix show pronounced softening and narrowing upon cooling below T ~ T_c. Based on control measurements on commercial Cu_{2}O powders and on a comparison to prior Raman scattering studies of other high-temperature superconductors, we speculate that proximity effects at La_{2-x}Ce_{x}CuO_{4}/Cu_{2}O interfaces may be responsible for these anomalies. Experiments on the slightly overdoped La_{2-x}Ce_{x}CuO_{4} film (x ~ 0.1) did not reveal comparable phonon anomalies.

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FormulaReported Tc (K)Pressure (GPa)Type
La2-xCexCuO4

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29Pressure not reportedunknown
La2-xCexCuO4

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

27Pressure not reportedunknown
La2-xCexCuO4

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

30Pressure not reportedunknown

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