Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer

Weides, M.; Peralagu, U.; Kohlstedt, H.; Pfeiffer, J.; Kemmler, M.; Gürlich, C.; Goldobin, E.; Koelle, D.; Kleiner, R.

Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer

Weides, M., Peralagu, U., Kohlstedt, H., Pfeiffer, J., Kemmler, M., Gürlich, C., Goldobin, E., Koelle, D., Kleiner, R.

arXiv:1006.5109 · 2010-08-09

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Abstract

We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses $d_1$ and $d_2$ in both halves were varied to obtain different combinations of positive and negative critical current densities $j_{c,1}$ and $j_{c,2}$. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	—