Long hold times in a two-junction electron trap
A. Kemppinen, S. V. Lotkhov, O. -P. Saira, A. B. Zorin, J. P. Pekola, A. J. Manninen
arXiv:1108.1684 · DOI 10.1063/1.3647557 · 2011-08-08 · Applied Physics Letters
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Abstract
The hold time $τ$ of a single-electron trap is shown to increase significantly due to suppression of environmentally assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of $τ$ by a factor exceeding $10^3$, up to about 10 hours, for a trap with only two superconductor (S) -- normal-metal (N) tunnel junctions and an on-chip resistor $R$ (R-SNS structure). In the normal state, the improved shielding made it possible to observe $τ\sim$ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 3 | Pressure not reported | unknown |
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