Geometry-dependent critical currents in superconducting nanocircuits
John R. Clem, Karl K. Berggren
arXiv:1109.4881 · DOI 10.1103/PhysRevB.84.174510 · 2011-09-22 · Physical Review B
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Abstract
In this paper we calculate the critical currents in thin superconducting strips with sharp right-angle turns, 180-degree turnarounds, and more complicated geometries, where all the line widths are much smaller than the Pearl length $Λ= 2 λ^2/d$. We define the critical current as the current that reduces the Gibbs free-energy barrier to zero. We show that current crowding, which occurs whenever the current rounds a sharp turn, tends to reduce the critical current, but we also show that when the radius of curvature is less than the coherence length this effect is partially compensated by a radius-of-curvature effect. We propose several patterns with rounded corners to avoid critical-current reduction due to current crowding. These results are relevant to superconducting nanowire single-photon detectors, where they suggest a means of improving the bias conditions and reducing dark counts. These results also have relevance to normal-metal nanocircuits, as these patterns can reduce the electrical resistance, electromigration, and hot spots caused by nonuniform heating.
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