A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

Thomas Quaglio; Franck Dahlem; Sylvain Martin; Anne Gerardin; Clemens Winkelmann; Hervé Courtois

doi:10.1063/1.4769258

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A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

Thomas Quaglio, Franck Dahlem, Sylvain Martin, Anne Gerardin, Clemens Winkelmann, Hervé Courtois

arXiv:1209.5502 · DOI 10.1063/1.4769258 · 2012-09-25 · The Review of scientific instruments

T3experimental9 citations

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Abstract

We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an individual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown