Switching Current Distributions in Josephson Junctions at Very Low Temperatures
James A. Blackburn, Matteo Cirillo, Niels Grønbech-Jensen
arXiv:1409.0066 · DOI 10.1209/0295-5075/107/67001 · 2014-08-30 · Europhysics Letters
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Abstract
Swept bias experiments carried out on Josephson junctions yield the distributions of the probabilities of early switching from the zero voltage state. Kramers' theory of thermally activated escape from a one-dimensional potential is well known to fall short of explaining such experiments when the junctions are at millikelvin temperatures. We propose a simple revision of the theory which is shown to yield extremely good agreement with experimental data.
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