Ultrafast Carrier Dynamics in the Large Magnetoresistance Material WTe$_{2}$

Y. M. Dai; J. Bowlan; H. Li; H. Miao; S. F. Wu; W. D. Kong; Y. G. Shi; S. A. Trugman; J. -X. Zhu; H. Ding; A. J. Taylor; D. A. Yarotski; R. P. Prasankumar

doi:10.1103/PhysRevB.92.161104

Ultrafast Carrier Dynamics in the Large Magnetoresistance Material WTe$_{2}$

Y. M. Dai, J. Bowlan, H. Li, H. Miao, S. F. Wu, W. D. Kong, Y. G. Shi, S. A. Trugman, J. -X. Zhu, H. Ding, A. J. Taylor, D. A. Yarotski, R. P. Prasankumar

arXiv:1506.07601 · DOI 10.1103/PhysRevB.92.161104 · 2015-06-25 · Physical Review B

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Abstract

Ultrafast optical pump-probe spectroscopy is used to track carrier dynamics in the large magnetoresistance material WTe$_{2}$. Our experiments reveal a fast relaxation process occurring on a sub-picosecond time scale that is caused by electron-phonon thermalization, allowing us to extract the electron-phonon coupling constant. An additional slower relaxation process, occurring on a time scale of $\sim$5-15 picoseconds, is attributed to phonon-assisted electron-hole recombination. As the temperature decreases from 300 K, the timescale governing this process increases due to the reduction of the phonon population. However, below $\sim$50 K, an unusual decrease of the recombination time sets in, most likely due to a change in the electronic structure that has been linked to the large magnetoresistance observed in this material.