Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_2$Cu$_3$O$_{7-δ}$ thin films

Nicolas Gauquelin; Hao Zhang; Guozhen Zhu; John Y. T. Wei; Gianluigi A. Botton

doi:10.1063/1.5011761

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Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_2$Cu$_3$O$_{7-δ}$ thin films

Nicolas Gauquelin, Hao Zhang, Guozhen Zhu, John Y. T. Wei, Gianluigi A. Botton

arXiv:1710.10667 · DOI 10.1063/1.5011761 · 2017-10-29 · AIP Advances

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Abstract

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa$_2$Cu$_3$O$_{7-δ}$ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La$_{2/3}$Ca$_{1/3}$MnO$_3$ (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO$_2$ planes, resulting in non-stoichiometric layer sequences that could directly impact the high-$T_c$ superconductivity.