← Back to search

Phase slip lines in superconducting few-layer NbSe$_2$ crystals

Nicola Paradiso, Anh-Tuan Nguyen, Karl Enzo Kloss, Christoph Strunk

arXiv:1811.06207 · DOI 10.1088/2053-1583/ab0bcc · 2018-11-15 · 2D Materials

T1theoretical37 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We show the results of two-terminal and four-terminal transport measurements on few-layer NbSe$_2$ devices at large current bias. In all the samples measured, transport characteristics at high bias are dominated by a series of resistance jumps due to nucleation of phase slip lines, the two dimensional analogue of phase slip centers. In point contact devices the relatively simple and homogeneous geometry enables a quantitative comparison with the model of Skocpol, Beasley and Tinkham. In extended crystals the nucleation of a single phase slip line can be induced by mechanical stress of a region whose width is comparable to the charge imbalance equilibration length.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
NbSe2

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown

Similar papers