Charge sensitivity of a cavity-embedded Cooper pair transistor limited by single-photon shot noise

S. Kanhirathingal; B. L. Brock; A. J. Rimberg; M. P. Blencowe

doi:10.1063/5.0062421

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Charge sensitivity of a cavity-embedded Cooper pair transistor limited by single-photon shot noise

S. Kanhirathingal, B. L. Brock, A. J. Rimberg, M. P. Blencowe

arXiv:2012.12313 · DOI 10.1063/5.0062421 · 2020-12-22 · Journal of Applied Physics

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Abstract

Using an operator scattering approach, we analyze the quantum dynamics of an ultrasensitive electrometer -- a Cooper pair transistor embedded in a quarter-wave microwave cavity (cCPT). While the cCPT is inherently a tunable, strongly nonlinear system affording a diverse range of functionalities, we restrict our present analysis to a necessary first investigation of its linear charge sensing capabilities, limiting to low pump powers corresponding to an average cavity photon number $\lesssim 1$. Assuming realizable cCPT parameters (B. L. Brock et al., Phys. Rev. Applied, 044009), and not including noise from the subsequent amplifier chain, we predict the fundamental, photon shot noise-limited charge sensitivity to be $0.12\, μ{\mathrm{e}}/\sqrt{\mathrm{Hz}}$ when the pumped cavity has an average of one photon and the cCPT is operated close to charge degeneracy. This is to be compared with a first reported charge sensitivity value $14\, μ{\mathrm{e}}/\sqrt{\mathrm{Hz}}$ in the single-photon regime (B. L. Brock et al., arXiv:2102.05362).