Determining the temperature-dependent London penetration depth in HTS thin films and its effect on SQUID performance

Abstract

The optimum design of high-sensitivity Superconducting Quantum Interference Devices (SQUIDs) and other devices based on thin HTS films requires accurate inductance modeling. This needs the London penetration depth $λ$ to be well defined, not only at 77 K, but also for any operating temperature, given the increasingly widespread use of miniature low-noise single-stage cryocoolers. Temperature significantly affects all inductances in any active superconducting device and cooling below 77 K can greatly improve device performance, however accurate data for the temperature dependence of inductance and $λ(T)$ for HTS devices is largely missing in the literature. We report here inductance measurements on a set of 20 different thin-film YBCO SQUIDs at 77 K with thickness $t = 220$ or 113 nm. By combining experimental data and inductance modeling we find an average penetration depth $λ(77) = 391$ nm at 77 K, which was independent of $t$. Using the same methods we derive an empirical expression for $λ(T)$ for a further three SQUIDs measured on a cryocooler from 50 to 79 K. Our measured value of $λ(77)$ and our inductance extraction procedures were then used to estimate the inductances and the effective areas of directly coupled SQUID magnetometers with large washer-style pick-up loops. The latter agree to better than 7% with experimentally-measured values, validating our measured value of $λ(77)$ and our inductance extraction methods.

Source-reported materials — not catalogue approval

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