A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments

Shaofeng Duan; Shichong Wang; Yuanyuan Yang; Chaozhi Huang; Lingxiao Gu; Haoran Liu; Wentao Zhang

doi:10.1063/5.0106299

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A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments

Shaofeng Duan, Shichong Wang, Yuanyuan Yang, Chaozhi Huang, Lingxiao Gu, Haoran Liu, Wentao Zhang

arXiv:2211.00823 · DOI 10.1063/5.0106299 · 2022-11-02 · The Review of scientific instruments

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Abstract

We present the development of a high-precision sample-position-autocorrection system for photoemission experiments. A binocular vision method based on image pattern matching calculations was realized to track the sample position with an accuracy better than 1 \um, which was much smaller than the spot size of the incident laser. We illustrate the performance of the sample-position-autocorrection system with representative photoemission data on the topological insulator Bi$_2$Se$_3$ and an optimally-doped cuprate superconductor \Bi. Our method provides new possibilities for studying the temperature-dependent electronic structures in quantum materials by laser-based or spatially resolved photoemission systems with high precision and efficiency.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Bi2Sr2CaCu2O8+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	91	Pressure not reported	unknown