← Back to search

${\mathrm{\textit{In situ}}}$ preparation of superconducting infinite-layer nickelate thin films with atomically flat surface

Wenjie Sun, Zhichao Wang, Bo Hao, Shengjun Yan, Haoying Sun, Zhengbin Gu, Yu Deng, Yuefeng Nie

arXiv:2401.15979 · DOI 10.1002/adma.202401342 · 2024-01-29 · Advanced Materials

T1experimental15 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

Since their discovery, the infinite-layer nickelates have been regarded as an appealing system for gaining deeper insights into high temperature superconductivity (HTSC). However, the synthesis of superconducting samples has been proved to be challenging. Here, we develop an ultrahigh vacuum (UHV) ${\mathrm{\textit{in situ}}}$ reduction method using atomic hydrogen as reducing agent and apply it in lanthanum nickelate system. The reduction parameters, including the reduction temperature (${\mathrm{\textit{T}_{R}}}$) and hydrogen pressure (${\mathrm{\textit{P}_{H}}}$), are systematically explored. We found that the reduction window for achieving superconducting transition is quite wide, reaching nearly 80$^\circ$C in ${\mathrm{\textit{T}_{R}}}$ and 3 orders of magnitude in ${\mathrm{\textit{P}_{H}}}$ when the reduction time is set to 30 mins. And there exists an optimal ${\mathrm{\textit{P}_{H}}}$ for achieving the highest ${\mathrm{\textit{T}_{c}}}$ if both ${\mathrm{\textit{T}_{R}}}$ and reduction time are fixed. More prominently, as confirmed by atomic force microscopy and scanning transmission electron microscopy, the atomically flat surface can be preserved during the ${\mathrm{\textit{in situ}}}$ reduction process, providing advantages over the ${\mathrm{\textit{ex situ}}}$ CaH$_2$ method for surface-sensitive experiments.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
La0.8Sr0.2NiO2

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure unresolvedonset
LaNiO2

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure unresolvedunknown
PrNiO2

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure unresolvedunknown
NdNiO2

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure unresolvedunknown
Nd6Ni5O12

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure unresolvedunknown

Similar papers