Growth and characterization of single crystal cubic TaN and hexagonal Ta$_2$N films on c-plane Sapphire

Abstract

Two single crystal phases of tantalum nitride were stabilized on c-plane sapphire using molecular beam epitaxy. The phases were identified to be $δ$-TaN with a rocksalt cubic structure and $γ$-Ta$_2$N with a hexagonal structure. Atomic force microscopy scans revealed smooth surfaces for both the films with root mean square roughnesses less than 0.3 nm. Phase-purity of these films was determined by x-ray diffraction. Raman spectrum of the phase-pure $δ$-TaN and $γ$-Ta$_2$N obtained will serve as a future reference to determine phase-purity of tantalum nitride films. Further, the room-temperature and low-temperature electronic transport measurements indicated that both of these phases are metallic at room temperature with resistivities of 586.2 $μΩ$-cm for the 30 nm $δ$-TaN film and 75.5 $μΩ$-cm for the 38 nm $γ$-Ta$_2$N film and become superconducting below 3.6 K and 0.48 K respectively. The superconducting transition temperature reduces with applied magnetic field as expected. Ginzburg-Landau fitting revealed a 0 K critical magnetic field and coherence length of 18 T and 4.2 nm for the 30 nm $δ$-TaN film and 96 mT and 59 nm for the 38 nm $γ$-Ta$_2$N film. These tantalum nitride films are of high interest for superconducting resonators and qubits.

Source-reported materials — not catalogue approval

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