Identify and Quantify Various Dissipation Mechanisms of Josephson Junction in Superconducting Circuits

Hao Deng; Huijuan Zhan; Lijuan Hu; Hui-Hai Zhao; Ran Gao; Kannan Lu; Xizheng Ma; Zhijun Song; Fei Wang; Tenghui Wang; Feng Wu; Tian Xia; Gengyan Zhang; Xiaohang Zhang; Chunqing Deng

Identify and Quantify Various Dissipation Mechanisms of Josephson Junction in Superconducting Circuits

Hao Deng, Huijuan Zhan, Lijuan Hu, Hui-Hai Zhao, Ran Gao, Kannan Lu, Xizheng Ma, Zhijun Song, Fei Wang, Tenghui Wang, Feng Wu, Tian Xia, Gengyan Zhang, Xiaohang Zhang, Chunqing Deng

arXiv:2508.15174 · 2025-08-21

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Abstract

Pinpointing the dissipation mechanisms and evaluating their impacts to the performance of Josephson junction (JJ) are crucial for its application in superconducting circuits. In this work, we demonstrate the junction-embedded resonator (JER) as a platform which enables us to identify and quantify various dissipation mechanisms of JJ. JER is constructed by embedding JJ in the middle of an open-circuit, 1/2 λ transmission-line resonator. When the 1st and 2nd harmonics of JER are excited, JJ experiences different boundary conditions, and is dominated by internal and external dissipations, respectively. We systematically study these 2 dissipation mechanisms of JJ by varying the JJ area and number. Our results unveil the completely different behaviors of these 2 dissipation mechanisms, and quantitatively characterize their contributions, shedding a light on the direction of JJ optimization in various applications.