Finite-temperature resistive transition in the two-dimensional XY gauge glass model
Beom Jun Kim
arXiv:cond-mat/0004069 · DOI 10.1103/PhysRevB.62.644 · 2000-04-05 · Physical Review B
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Abstract
We investigate numerically the resistive transition in the two-dimensional XY gauge glass model. The resistively-shunted junction dynamics subject to the fluctuating twist boundary condition is used and the linear resistances in the absence of an external current at various system sizes are computed. Through the use of the standard finite-size scaling method, the finite temperature resistive transition is found at $k_BT_c = 0.22(2)$ (in units of the Josephson coupling strength) with dynamic critical exponent $z = 2.0(1)$ and the static exponent $ν= 1.2(2)$, in contrast to widely believed expectation of the zero-temperature transition. Comparisons with existing experiments and simulations are also made.
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