Current-voltage characteristics of the two-dimensional XY model with Monte Carlo dynamics
Beom Jun Kim
arXiv:cond-mat/0010121 · DOI 10.1103/PhysRevB.63.024503 · 2000-10-07 · Physical Review B
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Abstract
Current-voltage characteristics and the linear resistance of the two-dimensional XY model with and without external uniform current driving are studied by Monte Carlo simulations. We apply the standard finite-size scaling analysis to get the dynamic critical exponent $z$ at various temperatures. From the comparison with the resistively-shunted junction dynamics, it is concluded that $z$ is universal in the sense that it does not depend on details of dynamics. This comparison also leads to the quantification of the time in the Monte Carlo dynamic simulation.
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