Frequency-dependent shot noise in long disordered SNS contacts
K. E. Nagaev
arXiv:cond-mat/0010442 · 2000-10-27 · arXiv: Mesoscale and Nanoscale Physics
Active bibliographic source — not scientific approval
Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.
Abstract
The shot noise in long diffusive SNS contacts is calculated using the semiclassical approach. At low frequencies and for purely elastic scattering, the voltage dependence of the noise is of the form S_I = (4Δ+ 2eV)/3R. The electron-electron scattering suppresses the noise at small voltages resulting in vanishing noise yet infinite dS_I/dV at V = 0. The distribution function of electrons consists of a series of steps, and the frequency dependence of noise exhibits peculiarities at ω= neV, ω= neV - 2Δ, and ω= 2Δ- neV for integer n.
Similar papers
Andreev Reflection Enhanced Shot Noise in Mesoscopic SNS Junctions
similarity 0.91X. Jehl et al. · 1999 · arXiv:cond-mat/9904089
Source status unknown — claims are unverified
Frequency-Dependent Shot Noise in Long Disordered Superconductor–Normal-Metal–Superconductor Contacts
similarity 0.90K. E. Nagaev
Source status unknown — claims are unverified
Finite-voltage shot noise in normal-metal–superconductor junctions
similarity 0.90A. L. Fauchère et al.
Source status unknown — claims are unverified
Imaging doubled shot noise in a Josephson scanning tunneling microscope
similarity 0.89K. M. Bastiaans et al. · 2019 · arXiv:1907.05808
Source status unknown — claims are unverified
Doubled shot noise in disordered normal-metal–superconductor junctions
similarity 0.89M. J. M. de Jong & C. W. J. Beenakker
Source status unknown — claims are unverified
Nonequilibrium Current Noise in Mesoscopic Disordered Superconductor–Normal-Metal–Superconductor Junctions
similarity 0.89Y. Naveh & D. V. Averin
Source status unknown — claims are unverified