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Characteristic features of the temperature dependence of the surface impedance in polycrystalline MgB$_2$ samples

Yu. A. Nefyodov, M. R. Trunin, A. F. Shevchun, D. V. Shovkun, N. N. Kolesnikov, M. P. Kulakov, A. Agliolo Gallitto, S. Fricano

arXiv:cond-mat/0107057 · DOI 10.1209/epl/i2002-00656-8 · 2001-07-03 · EPL (Europhysics Letters)

T1experimental9 citations

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Abstract

The real $R_s(T)$ and imaginary $X_s(T)$ parts of the surface impedance $Z_s(T)=R_s(T)+iX_s(T)$ in polycrystalline MgB$_2$ samples of different density with the critical temperature $T_c\approx 38$ K are measured at the frequency of 9.4 GHz and in the temperature range $5\le T<200$ K. The normal skin-effect condition $R_s(T)=X_s(T)$ at $T\ge T_c$ holds only for the samples of the highest density with roughness sizes not more than 0.1 $μ$m. For such samples extrapolation $T\to 0$ of the linear at $T<T_c/2$ temperature dependences $λ_L(T)=X_s(T)/ωμ_0$ and $R_s(T)$ results in values of the London penetration depth $λ_L(0)\approx 600$ Åand residual surface resistance $R_{res}\approx 0.8$ m$Ω$. In the entire temperature range the dependences $R_s(T)$ and $X_s(T)$ are well described by the modified two-fluid model.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
MgB2

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38Pressure not reportedunknown

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