Novel features of Josephson flux-flow in Bi-2212: contribution of in-plane dissipation, coherent response to mm-wave radiation, size effect
Yu. I. Latyshev, A. E. Koshelev, V. N. Pavlenko, M. Gaifullin, T. Yamashita, Y. Matsuda
arXiv:cond-mat/0109181 · DOI 10.1016/S0921-4534(01)01034-6 · 2001-09-10 · Physica C-superconductivity and Its Applications
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Abstract
We studied Josephson flux-flow (JFF) in Bi-2212 stacks fabricated from single crystal whiskers by focused ion beam technique. For long junctions with the in-plane sizes 30 x 2 (mu)m^2, we found considerable contribution of the in-plane dissipation to the JFF resistivity, (rho)_(Jff), at low temperatures. According to recent theory [A. Koshelev, Phys. Rev. B62, R3616 (2000)] that results in quadratic type dependence of (rho)_(Jff)(B) with the following saturation. The I-V characteristics in JFF regime also can be described consistently by that theory. In JFF regime we found Shapiro-step response to the external mm-wave radiation. The step position is proportional to the frequency of applied microwaves and corresponds to the Josephson emission from all the 60 intrinsic junctions of the stack being synchronized. That implies the coherence of the JFF over the whole thickness of the stack and demonstrates possibility of synchronization of intrinsic junctions by magnetic field. We also found a threshold character of an appearance of the JFF branch on the I-V characteristic with the increase of magnetic field, the threshold field B_t being scaled with the junction size perpendicular to the field L (L = 30-1.4 (mu)m), as B_t = (Phi)_0/Ls, where (Phi)_0 is flux quantum, s is the interlayer spacing. On the I-V characteristics of small stacks in the JFF regime we found Fiske-step features associated with resonance of Josephson radiation with the main resonance cavity mode in transmission line formed by stack.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Bi2Sr2CaCu2O8+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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