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The superconducting gap of \QTR{em}{in situ} $MgB_{2}$ thin films by microwave surface impedance measurements

N. Hakim, C. Kusko, S. Sridhar, A. Soukiassian, X. H. Zeng, X. X. Xi, .

arXiv:cond-mat/0212009 · DOI 10.1063/1.1517181 · 2002-12-01 · Applied Physics Letters

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Abstract

Precision measurements of the microwave surface resistance $R_{s}$ of in situ $MgB_{2}$ films directly reveal an exponential behavior of $R_{s}$ at low temperature indicating a fully-gapped order parameter. The entire temperature dependence of $R_{s}$ is well described by a Mattis-Bardeen formalism but with a small gap ratio of $Δ(0)/kT_{c}=0.72$, corresponding to $Δ(0)=1.9meV$.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
MgB2

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31Pressure not reportedunknown
MgB2

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34Pressure not reportedzero_resistance

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