Modifying the surface electronic properties of YBa2Cu3O7-delta with cryogenic scanning probe microscopy

S. Urazhdin; W. K. Neils; S. H. Tessmer; Norman O. Birge; D. J. Van Harlingen

doi:10.1088/0953-2048/17/1/015

← Back to search

Modifying the surface electronic properties of YBa2Cu3O7-delta with cryogenic scanning probe microscopy

S. Urazhdin, W. K. Neils, S. H. Tessmer, Norman O. Birge, D. J. Van Harlingen

arXiv:cond-mat/0310001 · DOI 10.1088/0953-2048/17/1/015 · 2003-09-30 · Superconductor Science and Technology

T310 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We report the results of a cryogenic study of the modification of YBa2Cu3O7-delta surface electronic properties with the probe of a scanning tunneling microscope (STM). A negative voltage applied to the sample during STM tunneling is found to modify locally the conductance of the native degraded surface layer. When the degraded layer is removed by etching, the effect disappears. An additional surface effect is identified using Scanning Kelvin Probe Microscopy in combination with STM. We observe reversible surface charging for both etched and unetched samples, indicating the presence of a defect layer even on a surface never exposed to air.