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A Novel Dielectric Anomaly in Cuprates and Nickelates: Signature of an Electronic Glassy State

Tuson Park, Z. Nussinov, K. R. A. Hazzard, V. A. Sidorov, A. V. Balatsky, J. L. Sarrao, S. -W. Cheong, M. F. Hundley, Jang-Sik Lee, Q. X. Jia, J. D. Thompson

arXiv:cond-mat/0404446 · DOI 10.1103/PhysRevLett.94.017002 · 2004-04-19 · Physical Review Letters

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Abstract

The low-frequency dielectric response of hole-doped insulators La_{2}Cu_{1-x}Li_{x}O_{4} and La_{2-x}Sr_{x}NiO_{4} shows a large dielectric constant ε^{'} at high temperature and a step-like drop by a factor of 100 at a material-dependent low temperature T_{f}. T_{f} increases with frequency and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge glass state is realized both in the cuprates and in the nickelates.

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