Temperature dependence of the resistance of a phase-slip line in a thin superconducting film
E. V. Il'ichev, V. I. Kuznetsov, V. A. Tulin
arXiv:cond-mat/0406581 · 2004-06-24 · Physics of the Solid State
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Abstract
An experimental investigation was made of the temperature dependence of the first step of a phase-slip line in a thin superconducting tin film. The depth of penetration of a nonequilibrium longitudinal electric field into the superconductor was determined near the critical temperature. A comparison was made with theoretical investigations of one-dimensional structures containing phase-slip centers. The experimental results were found to be in good agreement with the theory when the mechanism of mixing of electron-like and hole-like branches of the quasiparticle spectrum was governed by the elastic scattering of the excitations. This was one more experimental confirmation that a phase-slip line is a two-dimensional analog of a phase-slip center.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Sn Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 3.91 | Pressure not reported | unknown |
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