Characteristics of strong ferromagnetic Josephson junctions with epitaxial barriers

C. Bell; R. Loloee; G. Burnell; M. G. Blamire

doi:10.1103/PhysRevB.71.180501

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Characteristics of strong ferromagnetic Josephson junctions with epitaxial barriers

C. Bell, R. Loloee, G. Burnell, M. G. Blamire

arXiv:cond-mat/0502537 · DOI 10.1103/PhysRevB.71.180501 · 2005-02-22 · Physical Review B

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Abstract

We present the measurement of superconductor / ferromagnetic Josephson junctions, based on an epitaxial Nb bottom electrode and epitaxial Fe20Ni80 barrier. Uniform junctions have been fabricated with a barrier thicknesses in the range 2-12 nm. The maximum critical current density ~ 2.4 \pm 0.2 * 10^9 Am^-2 was found for a devices with a 3 nm thick barrier at 4.2 K, corresponding to an average characteristic voltage I_C R_N ~ 16 \muV. The I_C R_N showed a non-monotonic behavior with Fe20Ni80 thickness. The variation of the resistance of a unit area AR_N, of the junctions with barrier thickness gave a Nb/Py specific interface resistance of 6.0 \pm 0.5 fΩm^2 and Fe20Ni80 resistivity of 174 \pm 50 nΩm, consistent with other studies in polycrystalline samples.