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Evidence of ion diffusion at room temperature in microcrystals of the Bi2Sr2CaCu2O8+delta superconductor

M. Truccato, C. Lamberti, C. Prestipino, A. Agostino

arXiv:cond-mat/0506198 · DOI 10.1063/1.1938251 · 2005-06-08 · Applied Physics Letters

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Abstract

We have studied Bi-2212 microcrystals aged at ambient conditions for 40 days. Combined x-ray absorption near edge structure and x-ray fluorescence measurements with micrometer space resolution show both an increase of Cu$^{+}$ with respect to Cu$^{2+}$ and an enrichment in Cu vs Bi and Sr cation content near the sample edges in the b-axis direction. A parallel study on an electrically contacted sample has indirectly detected the O loss, observing both a resistivity increase and an increase in sample thickness near the edges. We conclude that the O out-diffusion along the b-axis is accompanied by Cu cation migration in the same direction.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Bi2Sr2CaCu2O8+δ

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79.1Pressure unresolvedunknown

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