← Back to search

Characterization of high-quality MgB2(0001) epitaxial films on Mg(0001)

Luca Petaccia, Cinzia Cepek, Silvano Lizzit, Rosanna Larciprete, Roberto Macovez, Massimo Sancrotti, Andrea Goldoni

arXiv:cond-mat/0509181 · DOI 10.1088/1367-2630/8/1/012 · 2005-09-07 · New Journal of Physics

T1theoretical14 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

High-grade MgB2(0001) films were grown on Mg(0001) by means of ultra-high-vacuum molecular beam epitaxy. Low energy electron diffraction and x-ray diffraction data indicate that thick films are formed by epitaxially oriented grains with MgB2 bulk structure. The quality of the films allowed angle-resolved photoemission and polarization dependent x-ray absorption measurements. For the first time, we report the band mapping along the Gamma-A direction and the estimation of the electron-phonon coupling constant l ~ 0.55 for the surface state electrons.

Similar papers