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3D XY and lowest Landau level fluctuations in deoxygenated YBCO thin films

K. Moloni, M. Friesen, Shi Li, V. Souw, P. Metcalf, L. Hou, M. McElfresh

arXiv:cond-mat/9703126 · DOI 10.1103/PhysRevLett.78.3173 · 1997-03-12 · Physical Review Letters

T2theoretical9 citations

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Abstract

Conductivity measurements reflect vortex solid melting in YBCO films. Field-independent glass exponents nu_g=1.9 and z_g=4.0 describe the transition T_g(H) for 0<H<26 T. At low fields, 3D XY exponents nu_{XY}=0.63 and z_{XY}=1.25 are also observed, with z_{XY} smaller than expected. These compete with glass scaling according to multicritical theory. A predicted power-law form of T_g(H) is observed for 0.5T_c<T_g<T_c. For T_g<0.5T_c, 3D XY scaling fails, but a lowest Landau level analysis becomes possible, obtaining T_{c2}(H) with positive curvature.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
YBa2Cu3O6.76

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

77Pressure not reportedzero_resistance
YBa2Cu3O6.43

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

61Pressure not reportedzero_resistance
YBa2Cu3O6.41

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

56Pressure not reportedzero_resistance
YBa2Cu3O6.43

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

60.8Pressure not reportedzero_resistance

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