Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope
Steven M. Anlage, D. E. Steinhauer, C. P. Vlahacos, B. J. Feenstra, A. S. Thanawalla, Wensheng Hu, Sudeep K. Dutta, F. C. Wellstood
arXiv:cond-mat/9811158 · DOI 10.1109/77.783934 · 1998-11-11 · IEEE Transactions on Applied Superconductivity
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Abstract
We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $μ$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-d Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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