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Low Temperature Penetration depth of κ-(ET)_2Cu[N(CN)_2]Br and κ-(ET)_2Cu(NCS)_2

A. Carrington, I. J. Bonalde, R. Prozorov, R. W. Giannetta, A. M. Kini, J. Schlueter, H. H. Wang, U. Geiser, J. M. Williams

arXiv:cond-mat/9906060 · DOI 10.1103/PhysRevLett.83.4172 · 1999-06-04 · Physical Review Letters

T1theoretical80 citations

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Abstract

We present high precision measurements of the penetration depth λof single crystals of κ-(ET)_2Cu[N(CN)2]Br and κ-(ET)_2Cu(NCS)_2 at temperature down to 0.4 K. We find that, at low temperatures, the in-plane penetration depth varies as a fractional power law, λ\sim T^1.5. W hilst this may be taken as evidence for novel bose excitation processes, we show that the data are also consistent with a quasi-linear variation of the superfluid density, as is expected for a d-wave superconductor with impurities. Our data for the interplane penetration depth show similar features and give a direct measurement of the absolute value, λ(0)=100\pm 20 μm.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
(ET)2Cu[N(CN)2]Br

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

11.6Pressure not reportedunknown
(ET)2Cu(NCS)2

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

9.6Pressure not reportedunknown

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