Tc max
0.5 K
Tc ambient
0.5 K
arXiv year
2025
Papers
1
Tc exp.
0.5 K
Tc theo.
—
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:2502.18723
Evidence (1 record from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.5 | — | thin_film | resistivity | — | 2025 | — | 2502.18723 |
Structure
- Crystal structure
- hexagonal structure
- Space group
- P3m1
- Lattice a (Å)
- 3.060
- Lattice c (Å)
- 4.919
Superconducting parameters
- Hc2
- 0.1 T (0 K)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- c-plane sapphire
- Pressure type
- none
- Doping type
- none