Tc max
40.0 K
Tc ambient
39.0 K
arXiv year
1987
Papers
6
Tc exp.
40.0 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.48.9689, confirmed by 4 papers
Evidence (9 records from 6 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 40.0 | — | polycrystal | resistivity, susceptibility | — | 1993 | T1 | DOI: 10.1103/PhysRevB.48.9689 |
| 39.0 | — | polycrystal | resistivity, susceptibility | — | 1989 | T1 | DOI: 10.1103/PhysRevB.40.2254 |
| 30.0 | — | polycrystal | resistivity | unknown | 1990 | T1 | DOI: 10.1103/PhysRevB.42.8049 |
| 30.0 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.7228 |
| 23.0 | — | polycrystal | resistivity | unknown | 1990 | T1 | DOI: 10.1103/PhysRevB.42.8049 |
| 15.0 | — | thin_film | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.35.7228 |
| 13.0 | — | polycrystal | resistivity | unknown | 1990 | T1 | DOI: 10.1103/PhysRevB.42.8049 |
| — | — | single_crystal | resistivity | — | 1994 | T1 | DOI: 10.1103/PhysRevB.50.7230 |
| — | — | polycrystal | susceptibility | — | 1990 | T1 | DOI: 10.1103/PhysRevB.41.2605 |
Structure
- Crystal structure
- K2NiF4 structure
- Phase
- cuprate_214
Superconducting parameters
- Pairing symmetry
- d-wave
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- polycrystal
- Substrate
- Al2O3
- Doping type
- hole
- Doping level
- 0.100