Tc max
0.3 K
Tc ambient
—
arXiv year
1999
Papers
11
Tc exp.
—
Tc theo.
0.3 K
Evidence
mixed
Tc max measured at theoretical (DFT/computational), thin_film, DOI: 10.1103/PhysRevMaterials.8.L101801
Evidence (11 records from 11 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 0.3 | — | thin_film | — | s-wave | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.L101801 |
| — | — | thin_film | STM | s-wave | 2025 | T1 | 2508.15184 |
| — |
Structure
- Crystal structure
- FCC
Superconducting parameters
- Pairing symmetry
- s-wave
- Gap structure
- full_gap
- λ_eph (e–ph coupling)
- 0.16
Samples & pressure
- Sample form
- thin_film
- Substrate
- Nb(110)
- Pressure type
- none
- Doping type
- none