Tc max
22.2 K
Tc ambient
—
arXiv year
2020
Papers
1
Tc exp.
—
Tc theo.
22.2 K
Evidence
theoretical
Tc max measured at theoretical (DFT/computational), thin_film, DOI: 10.1103/PhysRevB.101.214514
Evidence (6 records from 1 paper)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 22.2 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214514 |
| 19.5 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214514 |
| 13.1 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214514 |
| 11.9 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214514 |
| 9.6 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214514 |
| 8.6 | — | thin_film | — | — | 2020 | T1 | DOI: 10.1103/PhysRevB.101.214514 |
Structure
- Crystal structure
- hollow coverage
Superconducting parameters
- λ_eph (e–ph coupling)
- 1.56
- ω_log
- 469 K
Samples & pressure
- Doping level
- 0.200