Tc max
6.2 K
Tc ambient
—
arXiv year
1987
Papers
2
Tc exp.
6.2 K
Tc theo.
—
Evidence
experimental
Tc max measured at polycrystal, resistivity, DOI: 10.1103/PhysRevB.36.9115
Evidence (2 records from 2 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 6.2 | — | polycrystal | resistivity | — | 1987 | T1 | DOI: 10.1103/PhysRevB.36.9115 |
| — | — | thin_film | resistivity | — | 2022 | T3 | 2207.05343 |
Superconducting parameters
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Substrate
- SOI