Tc max
4.6 K
Tc ambient
—
arXiv year
1990
Papers
23
Tc exp.
4.6 K
Tc theo.
5.5 K
Evidence
experimental
Tc max measured at thin_film, resistivity, arXiv:1507.06146, confirmed by 4 papers
Evidence (25 records from 23 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Tier | Paper |
|---|---|---|---|---|---|---|---|
| 5.5 | — | — | — | p-wave | 2017 | T1 | 1707.03754 |
| 4.6 | — | thin_film | resistivity | — | 2015 | T1 | 1507.06146 |
| 4.5 | — | wire | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.247003 |
| 4.0 | — | wire | resistivity | — | 2009 | T1 | DOI: 10.1103/PhysRevLett.102.247003 |
| 4.0 | — | thin_film | — | — | 2016 | T1 | 1601.07591 |
| 3.0 | — | thin_film | resistivity | — | 2019 | T1 | DOI: 10.1103/PhysRevLett.122.247002 |
| 1.0 | — | thin_film | — | s-wave | 2024 | T1 | DOI: 10.1103/PhysRevMaterials.8.L101801 |
| 1.0 | — | thin_film | — | d-wave | 2019 | T1 | DOI: 10.1103/PhysRevB.100.125432 |
| 0.5 | — | — | — | p-wave | 2017 | T1 | 1707.03754 |
| — | — | thin_film | resistivity | — | 2026 | T1 | DOI: 10.1103/pc88-8kp6 |
| — | — | thin_film | STM | — | 2025 | — | 2505.08914 |
| — | — | — | — | — | 2024 | T3 | 2406.16621 |
| — | — | wire | resistivity | — | 2024 | T1 | DOI: 10.1103/PhysRevLett.133.246601 |
| — | — | thin_film | STM, resistivity | — | 2023 | — | 2309.14133 |
| — | — | thin_film | STM | — | 2023 | T1 | DOI: 10.1103/PhysRevB.108.024511 |
| — | — | — | STM | s-wave | 2019 | T1 | 1901.03886 |
| — | — | thin_film | — | — | 2019 | T1 | 1902.09664 |
| — | — | thin_film | STM | — | 2018 | T1 | DOI: 10.1103/PhysRevB.98.214513 |
| — | — | wire | resistivity | — | 2018 | T1 | 1803.07863 |
| — | — | nanoparticle | resistivity | — | 2015 | T1 | DOI: 10.1103/PhysRevB.92.184501 |
| — | — | single_crystal | resistivity | — | 2011 | T1 | 1103.2173 |
| — | — | thin_film | resistivity | — | 2003 | T3 | cond-mat/0303195 |
| — | — | — | susceptibility | — | 2000 | T1 | cond-mat/0011176 |
| — | — | thin_film | resistivity | — | 1996 | T1 | DOI: 10.1103/PhysRevB.54.10074 |
| — | — | thin_film | — | — | 1990 | T1 | DOI: 10.1103/PhysRevLett.64.2172 |
Superconducting parameters
- Hc2
- 6.0 T (B perpendicular to plane)
- λ_eph (e–ph coupling)
- 0.22
Samples & pressure
- Sample form
- thin_film
- Substrate
- V(100)