Tc max
0.8 K
Tc ambient
0.8 K
Discovery
1999
Papers
7
Tc max measured at ambient, thin_film, resistivity, arXiv:cond-mat/0307629, confirmed by 4 papers
Evidence (8 records from 7 papers)
the flat columns above are aggregates — each line here is one paper's claim| Tc (K) | P (GPa) | Sample | Method | Pairing | Year | Paper |
|---|---|---|---|---|---|---|
| 0.8 | ambient | thin_film | resistivity, STM | — | 2003 | cond-mat/0307629 |
| 0.8 | ambient | thin_film | resistivity | — | 2001 | cond-mat/0110281 |
| 0.5 | ambient | thin_film | resistivity | — | 2004 | cond-mat/0410567 |
| 0.3 | ambient | thin_film | resistivity | — | 1999 | cond-mat/9908281 |
| 0.1 | ambient | thin_film | resistivity | — | 1999 | cond-mat/9908281 |
| — | ambient | thin_film | resistivity | — | 2001 | cond-mat/0110220 |
| — | ambient | wire | resistivity | — | 2000 | cond-mat/0011522 |
| — | ambient | thin_film | resistivity | — | 1999 | cond-mat/9912003 |
Superconducting parameters
- Hc2
- 0.6 T (25 mK, H parallel to the film plane)
- λ_eph (e–ph coupling)
- —
Samples & pressure
- Sample form
- thin_film
- Substrate
- MgO_x/Mg
- Pressure type
- none